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 HB56UW1673E-F
Description
The HB 56UW 1673E belongs to 8-byte DI MM (D ual in-line Memory Module) fa mily , and have bee n developed an optimized main memory solution for 4 and 8-byte processor applications. The HB56UW1673E is a 16 M x 72 Dyna mic R AM Module, mounted 18 piec es of 64-Mbit DR AM (H M5165405) sea led in TS OP pac kage and 2 piec es of 16-bit line drive r sea led in TS SOP pac kage . The HB 56UW 1673E off ers Extende d Da ta Out (ED O) P age Mode as a high spee d ac ce ss mode. An outline of the HB 56UW 1673E is 168-pin socke t type pac kage (dua l lea d out). The ref ore, the HB 56UW 1673E make s high density mounting possible without surface mount technology. The HB56UW1673E provides common data inputs and outputs. Decoupling capacitors are mounted beside each TSOP on the its module board.
Features
* 168-pin socket type package (Dual lead out) Lead pitch : 1.27 mm * Single 3.3 V supply : 3.3 0.3 V * High speed Access time: tRAC = 50 ns/60 ns (max) Access time: tCAC = 18 ns/20 ns (max) * Low power dissipation Active mode: 8.46 W/7.16 W (max) Standby mode (TTL): 166 mW (max) * Buffered input except RAS and DQ * 4 byte interleave enabled, dual address input (A0/B0)
Elpida Memory, Inc. is a joint venture DRAM company of NEC Corporation and Hitachi, Ltd.
EO
128MB Buffered EDO DRAM DIMM 16-Mword x 72-bit, 4k Refresh, 1 Bank Module (18 pcs of 16M x 4 components)
E0101H10 (1st edition) (Previous ADE-203-1123A (Z)) Jan. 31, 2001
This Product become EOL in August, 2005.
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HB56UW1673E-F
* * * * JEDEC standard outline buffered 8-byte DIMM EDO page mode capability 4096 refresh cycles: 64 ms 2 variations of refresh RAS-only refresh CAS-before-RAS refresh
Ordering Information
Type No. HB56UW1673E-5F HB56UW1673E-6F
Pin Arrangement
Pin No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
EO
50 ns 60 ns Signal name Pin No. VSS DQ0 DQ1 DQ2 DQ3 VCC DQ4 DQ5 DQ6 DQ7 DQ8 VSS DQ9 DQ10 DQ11 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57
Access time
Package 168-pin dual lead out socket type
Contact pad Gold
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1 pin 10 pin 11 pin 40 pin 41 pin 84 pin 85 pin 94 pin 95 pin 124 pin 125 pin
Data Sheet E0101H10 2
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168 pin
Signal name Pin No. VSS 85
Signal name Pin No. VSS 127
Signal name VSS
uc od
DQ36 DQ37 DQ38 DQ39 128 129 130 131 NC NC NC NC VCC 132 PDE VCC NC NC DQ40 133 DQ41 DQ42 134 135 DQ43 DQ44 136 137 DQ54 DQ55 VSS 138 VSS DQ45 139 DQ56 DQ46 DQ47 140 141 DQ57 DQ58
OE2 RE2 CE4 NC WE2 VCC NC NC DQ18 DQ19 VSS DQ20 DQ21 DQ22
86 87 88 89 90 91 92 93 94 95 96 97 98 99
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HB56UW1673E-F
Pin Arrangement (cont)
Pin No. 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 Signal name Pin No. DQ12 DQ13 VCC 58 59 Signal name Pin No. DQ23 VCC DQ24 NC NC NC NC DQ25 DQ26 DQ27 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 Signal name Pin No. DQ48 DQ49 VCC DQ50 DQ51 DQ52 DQ53 VSS NC NC VCC NC NC NC NC 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 Signal name DQ59 VCC DQ60 NC NC NC NC DQ61 DQ62 DQ63 VSS DQ64 DQ65 DQ66 DQ67 VCC DQ68 DQ69 DQ70 DQ71 VSS
EO
60 DQ14 DQ15 DQ16 DQ17 VSS 61 62 63 64 65 NC NC VCC WE0 CE0 NC RE0 OE0 VSS A0 A2 A4 A6 A8 A10 NC VCC NC NC 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84
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VSS DQ28 DQ29 DQ30 DQ31 VCC DQ32 DQ33 DQ34 DQ35 VSS PD1 PD3 PD5 PD7 ID0(VSS ) VCC
Data Sheet E0101H10 3
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115 NC VSS A1 A3 A5 116 117 118 119 120 121 122 123 124 125 126 A7 A9 A11 NC VCC NC B0
uc od
163 164 165 PD2 PD4 PD6 166 PD8 167 ID1 (VSS ) 168 VCC
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HB56UW1673E-F
Pin Description
Pin name A0 to A11, B0 Function Address input Row address A0 to A11, B0 Column address A0 to A11, B0 Refresh address A0 to A11, B0 Data input/output Row address strobe (RAS) Column address strobe (CAS) Read/Write enable Output enable Presence detect
DQ0 to DQ71 RE0, RE2 CE0, CE4 OE0, OE2
WE0, WE2
PD1 to PD8 ID0, ID1 PDE VCC VSS NC
Presence Detect Pin Assignment (Controlled by PDE pin)
PDE = Low Pin name PD1 PD2 PD3 PD4 PD5 PD6 PD7 PD8 Pin No. 79 163 80 164 81 165 82 166 50 ns 1 1 1 1 1 0 0 0 60 ns 1 1 1 1 1 1 1 0
1 : High level (driver output) 0 : Low level (driver output)
EO
L
ID bit Ground
Presence detect Enable Power supply
Data Sheet E0101H10 4
Pr
No connection
PDE = High All
uc od
High-Z High-Z High-Z High-Z High-Z High-Z High-Z High-Z
t
HB56UW1673E-F
Block Diagram
RE0 CE0 WE0 OE0 RE2 CE4 WE2 OE2 DQ36 DQ37 DQ38 DQ39 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 DQ64 DQ65 DQ66 DQ67 DQ68 DQ69 DQ70 DQ71 CAS RAS WE OE I/O I/O D9 I/O I/O CAS RAS WE OE I/O I/O D10 I/O I/O CAS RAS WE OE I/O I/O D11 I/O I/O CAS RAS WE OE I/O I/O D12 I/O I/O CAS RAS WE OE I/O I/O D13 I/O I/O CAS RAS WE OE I/O I/O D14 I/O I/O CAS RAS WE OE I/O I/O D15 I/O I/O CAS RAS WE OE I/O I/O D16 I/O I/O CAS RAS WE OE I/O I/O D17 I/O I/O
EO
DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 DQ32 DQ33 DQ34 DQ35 A0 B0 A1 to A11 VCC VSS
CAS RAS WE OE I/O I/O D0 I/O I/O CAS RAS WE OE I/O I/O D1 I/O I/O CAS RAS WE OE I/O I/O D2 I/O I/O CAS RAS WE OE I/O I/O D3 I/O I/O CAS RAS WE OE I/O I/O D4 I/O I/O CAS RAS WE OE I/O I/O D5 I/O I/O CAS RAS WE OE I/O I/O D6 I/O I/O CAS RAS WE OE I/O I/O D7 I/O I/O CAS RAS WE OE I/O I/O D8 I/O I/O
VCC VCC VCC VCC D0 to D17, 16-bit line driver VCC 0.22 F x 20 pcs VCC VSS *D0 to D17: HM5165405 VCC : 16-bit line driver VSS VSS
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D0 to D8 D9 to D17 D0 to D17 D0 to D17,16-bit line driver
Data Sheet E0101H10 5
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PD1 to PD8
uc od
PD1 PD2 PD3 PD4 PD5 PD6 PD7 PD8
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HB56UW1673E-F
Absolute Maximum Ratings
Parameter Terminal voltage on any pin relative to VSS Power supply voltage relative to VSS Short circuit output current Power dissipation Symbol VT VCC Iout PT Tstg Value -0.5 to +4.6 -0.5 to +4.6 50 19 -55 to +125 Unit V V mA W C
Storage temperature range
DC Operating Conditions
Parameter Supply voltage
Input high voltage Input low voltage
Ambient temperature range
Notes: 1. All voltage referred to VSS . 2. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level.
EO
VCC VSS VIH VIL Ta
Symbol
Min 3.0 0
Typ 3.3 0 -- -- --
Max 3.6 0 VCC + 0.3 0.8 70
Unit V V V V C
Notes 1, 2 2 1 1
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2.0 0
-0.3
Data Sheet E0101H10 6
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HB56UW1673E-F
DC Characteristics
HB56UW1673E
Parameter
Operating current* , * 2
1
Standby current
RAS-only refresh current* 2 Standby current*
1
CAS-before-RAS refresh current
EDO page mode current* 1, * 3 Input leakage current Output leakage current Output high voltage Output low voltage
Notes : 1. I CC depends on output load condition when the device is selected. I CC max is specified at the output open condition. 2. Address can be changed once or less while RAS = VIL. 3. Measured with one sequential address change per EDO cycle, t HPC .
Capacitance (Ta = 25C, VCC = 3.3 V 0.3 V)
Parameter Input capacitance (Address) Input capacitance (CAS, WE, OE) Input capacitance (RAS) I/O capacitance (DQ) Symbol CI1 CI2 CI3 CI/O
Notes : 1. Capacitance measured with Boonton Meter or effective capacitance measuring method. 2. CAS = VIH to disable Dout.
EO
I CC1 I CC2 I CC3 I CC5 I CC6 I CC7 I LI I LO VOH VOL
50 ns Max 2350 46
60 ns Min -- -- Max 1990 46 Unit mA mA Test conditions t RC = min TTL interface RAS, CAS = VIH Dout = High-Z CMOS interface RAS, CAS VCC - 0.2 V Dout = High-Z t RC = min RAS = VIH, CAS = VIL Dout = enable t RC = min RAS = VIL , CAS cycle, t HPC = t HPC min 0 V Vin VCC + 0.3 V 0 V Vout VCC Dout = disable High Iout = -2 mA Low Iout = 2 mA
Symbol Min -- --
--
19
--
19
mA
-- -- -- --
2350 100
-- -- -- -- -5 -5
1990 100 1990 1810 5 5
mA mA mA mA A A
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-5 -5 5 5 2.4 0 VCC 0.4
2350 1990
Data Sheet E0101H10 7
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2.4 0 VCC 0.4 V V Typ -- -- -- -- Max 20 20 78 20
uc od
Unit pF pF pF pF Notes 1 1 1 1, 2
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HB56UW1673E-F
AC Characteristics (Ta = 0 to +70C, VCC = 3.3 V 0.3 V, VSS = 0 V) *1 , *2 ,*19
Test Conditions * * * * *
Read, Write, Read-Modify-Write and Refresh Cycles (Common parameters)
50 ns Max -- -- -- 10000 10000 60 ns Min 104 40 10 60 10 Max -- -- -- 10000 10000 -- -- -- -- 40 25 -- -- -- -- Unit ns ns ns ns ns ns ns ns ns ns ns 3 4 Notes
Parameter
Random read or write cycle time RAS precharge time CAS precharge time RAS pulse width CAS pulse width Row address setup time Row address hold time Column address setup time Column address hold time RAS to CAS delay time
RAS to column address delay time RAS hold time CAS hold time CAS to RAS precharge time OE to Din delay time OE delay time from Din CAS delay time from Din Transition time (rise and fall)
EO
Input rise and fall times: 2 ns Input levels: VIL = 0 V, VIH = 3.0 V Input timing reference levels: 0.8 V, 2.0 V Output timing reference levels: 0.8 V, 2.0 V Output load: 1 TTL gate + C L (100 pF) (Including scope and jig)
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t RC t RP t CP t RAS t CAS t ASR 8 8 5 8 0 8 t RAH t ASC t CAH t RCD t RAD t RSH t CSH t CRP t OED t DZO t DZC tT 0 0 2
Symbol Min 84 30
50
Data Sheet E0101H10 8
Pr
-- 5 -- 10 -- 0 -- 10 14 12 20 40 10 20 12 10 18 38 10 18 32 20 -- -- -- -- -- -- 0 0 50 2
uc od
ns ns ns ns 5 -- -- ns ns 6 6 50 ns 7
t
HB56UW1673E-F
Read Cycle
50 ns Parameter Symbol Min t RAC t CAC t AA t OEA t RCS t RCH t RCHR t RRH -- -- -- -- 0 0 50 0 Max 50 18 30 18 -- -- -- -- -- -- -- -- -- 18 18 -- 60 ns Min -- -- -- -- 0 0 60 0 35 18 2 3 3 -- -- Max 60 20 35 20 -- -- -- -- -- -- -- -- -- 20 20 -- -- 15 20 -- -- Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 13, 21 13 5 21 13, 21 13 21 12 12 Notes 8, 9 9, 10, 17 9, 11, 17 9
Access time from RAS Access time from CAS Access time from OE
Access time from address
Read command setup time
Read command hold time to CAS Read command hold time to RAS
Read command hold time from RAS Column address to RAS lead time Column address to CAS lead time CAS to output in low-Z Output data hold time
Output data hold time from OE Output buffer turn-off time Output buffer turn-off to OE CAS to Din delay time Output data hold time from RAS Output buffer turn-off to RAS Output buffer turn-off to WE WE to Din delay time RAS to Din delay time
Write Cycle
50 ns Parameter Write command setup time Write command hold time Write command pulse width Write command to RAS lead time Write command to CAS lead time Data-in setup time Data-in hold time Symbol Min t WCS t WCH t WP t RWL t CWL t DS t DH 0 8 8 18 8 0 13
EO
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t RAL t CAL t CLZ 2 3 3 t OH t OHO t OFF t OEZ t CDD t OHR t OFR 3 t WEZ t WED t RDD
30 15
Data Sheet E0101H10 9
Pr
-- -- 18 20 -- 3 -- -- 13 18 -- -- -- -- 18 13 20 15 60 ns Max -- Min 0 -- -- -- -- 10 10 20 10 -- 0 -- 15
uc od
Max -- Unit ns Notes 14 -- -- -- -- ns ns ns ns -- ns 15 -- ns 15
t
HB56UW1673E-F
Read-Modify-Write Cycle
HB56UW1673E 50 ns Symbol Min t RWC t RWD t CWD t AWD t OEH 116 72 30 42 13 Max -- -- -- -- -- 60 ns Min 140 84 34 49 15 Max -- -- -- -- -- Unit ns ns ns ns ns 14 14 14 Notes
Parameter
Read-modify-write cycle time RAS to WE delay time CAS to WE delay time OE hold time from WE
Column address to WE delay time
Refresh Cycle
Parameter
CAS setup time (CBR refresh cycle) CAS hold time (CBR refresh cycle) WE setup time (CBR refresh cycle) WE hold time (CBR refresh cycle) RAS precharge to CAS hold time
EDO Page Mode Cycle
Parameter EDO page mode cycle time EDO page mode RAS pulse width Access time from CAS precharge RAS hold time from CAS precharge Output data hold time from CAS low CAS hold time referred OE CAS to OE setup time Read command hold time from CAS precharge
Write pulse width during CAS precharge t WPE OE precharge time t OEP
10
EO
L
t CSR t CHR 8 5 8 5 t WRP t WRH t RPC t HPC t RASP t CPA t CPRH t DOH t COL t COP t RCHC 3 8 5 8 8
50 ns Max -- --
60 ns Min 10 10 Max -- -- -- -- -- Unit ns ns ns ns ns Notes
Symbol Min 10
Symbol Min 20 -- -- 33
Data Sheet E0101H10
Pr
-- 5 -- 10 -- 5 50 ns 60 ns Max -- Min 25 100000 -- 33 -- -- -- -- 40 3 10 -- 5 28 -- -- -- 35 10 10
uc od
Max -- Unit ns Notes 20 100000 ns ns ns 16 40 -- 9, 17 -- ns 9, 22 -- ns -- ns -- -- -- ns ns ns
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HB56UW1673E-F
EDO Page Mode Read-Modify-Write Cycle
50 ns Parameter Symbol Min t HPRWC t CPW 57 45 Max -- -- 60 ns Min 68 54 Max -- -- Unit ns ns 14 Notes
EDO page mode read- modify-write cycle time
WE delay time from CAS precharge
Refresh
Parameter
Refresh period
Notes: 1. AC measurements assume t T = 2 ns. 2. An initial pause of 200 s is required after power up followed by a minimum of eight initialization cycles (any combination of cycles containing RAS-only refresh or CAS-before-RAS refresh). 3. Operation with the t RCD (max) limit insures that t RAC (max) can be met, t RCD (max) is specified as a reference point only; if t RCD is greater than the specified t RCD (max) limit, than the access time is controlled exclusively by t CAC . 4. Operation with the t RAD (max) limit insures that t RAC (max) can be met, t RAD (max) is specified as a reference point only; if t RAD is greater than the specified t RAD (max) limit, then access time is controlled exclusively by t AA . 5. Either t OED or t CDD must be satisfied. 6. Either t DZO or t DZC must be satisfied. 7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition times are measured between VIH (min) and VIL (max). 8. Assumes that t RCD t RCD (max) and t RAD t RAD (max). If t RCD or t RAD is greater than the maximum recommended value shown in this table, t RAC exceeds the value shown. 9. Measured with a load circuit equivalent to 1 TTL loads and 100 pF. 10. Assumes that t RCD t RCD (max) and t RCD + t CAC (max) t RAD + t AA (max). 11. Assumes that t RAD t RAD (max) and t RCD + t CAC (max) t RAD + t AA (max). 12. Either t RCH or t RRH must be satisfied for a read cycles. 13. t OFF (max), t OEZ (max), t WEZ (max) and t OFR (max) define the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels. 14. t WCS , t RWD, t CWD, t AWD and t CPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only; if t WCS t WCS (min), the cycle is an early write cycle and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if t RWD t RWD (min), t CWD t CWD (min), and t AWD t AWD (min), or t CWD t CWD (min), t AWD t AWD (min) and t CPW t CPW (min), the cycle is a read-modify-write and the data output will contain data read from the selected cell; if neither of the above sets of conditions is satisfied, the condition of the data out (at access time) is indeterminate. 15. t DS and t DH are referred to CAS leading edge in early write cycles and to WE leading edge in delayed write or read-modify-write cycles. 16. t RASP defines RAS pulse width in EDO page mode cycles. 17. Access time is determined by the longest among t AA , t CAC and t CPA. 18. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data to the device.
EO
t REF
Symbol
Max 64
Unit ms
Notes 4096 cycles
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Data Sheet E0101H10 11
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HB56UW1673E-F
19. When output buffers are enabled once, sustain the low impedance state until valid data is obtained. When output buffer is turned on and off within a very short time, generally it causes large VCC/V SS line noise, which causes to degrade VIH min/VIL max level. 20. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle (EDO page mode mix cycle (1), (2)), minimum value of CAS cycle (tCAS + t CP + 2 t T) becomes greater than the specified t HPC (min) value. The value of CAS cycle time of mixed EDO page mode is shown in EDO page mode mix cycle (1) and (2). 21. Data output turns off and becomes high impedance from later rising edge of RAS and CAS. Hold time and turn off time are specified by the timing specifications of later rising edge of RAS and CAS between t OHR and t OH and between t OFR and t OFF. 22. t DOH defines the time at which the output level go cross. VOL = 0.8 V, VOH = 2.0 V of output timing reference level. 23. XXX: H or L (H: VIH (min) VIN VIH (max), L: VIL (min) VIN VIL (max)) ///////: Invalid Dout When the address, clock and input pins are not described on timing waveforms, their pins must be applied VIH or VIL.
12
EO
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Data Sheet E0101H10
Pr uc od t
HB56UW1673E-F
Timing Waveforms*23
Read Cycle
;
tDZO tOEA tOED OE tCAC tAA tRAC tCLZ tOEZ tOHO tOFF tOH tOFR tOHR tWEZ Dout Dout Data Sheet E0101H10 13
EO
RAS tT CAS tRAD tASR tRAH Address Row WE Din
tRC tRAS
tRP
tCSH tRSH tCAS
tCRP
tRCD
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tASC Column tRCS tDZC
tRAL tCAL
tCAH
Pr
tRCHR tRCH High-Z
tRRH
tCDD
tWED
uc od
tRDD
t
HB56UW1673E-F
Early Write Cycle
tRC tRAS tRP
14
EO
RAS tT CAS tASR tRAH Address Row WE Din Dout
tCSH tRSH tCAS
tCRP
tRCD
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tASC tCAH Column tWCS tDS Data Sheet E0101H10
Pr
tWCH
uc od
High-Z* * t WCS t WCS (min)
tDH
Din
t
HB56UW1673E-F
Delayed Write Cycle*18
tRC tRAS
;
tDZO tOED tOEH tOEP OE tOEZ tCLZ Dout High-Z Invalid Dout Data Sheet E0101H10
EO
RAS tT CAS tASR tRAH Address Row WE Din
tRP
tCSH tRSH tCAS
tCRP
tRCD
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tASC tCAH Column tCWL tRWL tWP tRCS tDZC High-Z
Pr
tDS tDH
uc od
Din
t
15
HB56UW1673E-F
Read-Modify-Write Cycle*18
tRWC tRAS
;
tDZO tOED tOEH tOEA tOEP OE tCAC tAA tOEZ tRAC tOHO Dout Dout High-Z tCLZ Data Sheet E0101H10 16
EO
RAS tT CAS tASR tRAH Address Row WE Din
tRP
tRCD
tCAS
tCRP
tRAD
L
tASC tRCS tDZC
tCAH
Column tCWD tAWD tRWD tCWL
Pr
tRWL tWP tDS High-Z Din
tDH
uc od t
HB56UW1673E-F
RAS-Only Refresh Cycle
tRC tRAS tRP
;
EO
RAS
tT
tCRP
tRPC
tCRP
CAS
tASR
tRAH
L
Row
Address
tOFR tOFF
Pr
High-Z
Dout
uc od t
17
Data Sheet E0101H10
HB56UW1673E-F
CAS-Before-RAS Refresh Cycle
tRC tRAS tRP tRAS tRC tRP
;
Data Sheet E0101H10 18
EO
tRP RAS tT tRPC tCP tCSR CAS tWRP WE Address tOFR tOFF Dout
tRPC tCHR tCP tCSR tCHR
tCRP
L
tWRH High-Z
tWRP
tWRH
Pr uc od t
HB56UW1673E-F
EDO Page Mode Read Cycle (1)
t RP t RASP t HPC t CAS t CP t HPC tCAS t RCHC t HPC t CPRH t CP t t CRP
;
tWEZ tCAC tRAC tOEA tDOH tOHO tOEA
Dout
EO
RAS
tT
t CSH
t CP
RSH
CAS
t CAS
tCAS t RRH t RCH
t RCS
t RCHR
t RCH t RCS
WE
tASR
tRAH tASC
tCAH
t WPE t ASC t CAH Column 2
t ASC t CAH Column 3 t CAL
tASC
t RAL t CAH
Column 4
t WED
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t CAL t CAL High-Z tCOL t OEP tOEA tCPA tAA tCAC tOEZ tOHO Dout 1 Dout 2
Address
Row
Column 1
t CAL tRDD tCDD
tDZC
Din
Pr
tOEP tCPA tAA tCAC tOEZ Dout 2 Dout 3
tDZO
tCOP tOED
OE
tCPA tAA
tCAC tAA
tOFR tOHR tOEZ tOHO tOFF tOH
uc od
Dout 4
t
Data Sheet E0101H10 19
HB56UW1673E-F
EDO Page Mode Read Cycle (2)
t RP t RASP t HPC t CAS tHPC t CP t CAS t RCHC t CP t HPC tRSH tCAS t RRH t RCH t CRP
;
tOHO tOEZ tRAC tDOH tOEA tCAC tDOH tOHO tOEA
Dout
20
EO
RAS
tT
t CSH
t CP
CAS
t CAS
t RCS
WE
tASR
tRAH tASC
tCAH
t ASC t CAH Column 2
t ASC t CAH Column 3 t CAL
tASC
t RAL t CAH
Column 4
t WED
L
t CAL High-Z tOEA tCPA tAA tCAC Dout 1
Address
Row
Column 1
t CAL
t CAL
tRDD tCDD
tDZC
Din
Pr
tCOL t OEP tOEP tOEZ tCPA tAA tCAC Dout 2 Dout 2 Dout 3
tDZO
tCOP tOED
OE
tCPA tAA
tCAC tAA
tOFR tOHR tOEZ tOHO tOFF tOH
uc od
Dout 4
t
Data Sheet E0101H10
HB56UW1673E-F
EDO Page Mode Early Write Cycle
tRASP tRP
EO
RAS tT tCSH tRCD CAS tASR tRAH tASC Address Row tWCS WE tDS Din Dout
tHPC tCAS tCP tCAS tCP
tRSH tCAS tCRP
L
tCAH Column 1 tWCH tDH Din 1
tASC
tCAH
tASC
tCAH
Column 2
Column N
Data Sheet E0101H10 21
Pr
tWCS tWCH tWCS tDS tDH tDS Din 2 High-Z*
tWCH
uc od
tDH Din N * t WCS t WCS (min)
t
HB56UW1673E-F
EDO Page Mode Delayed Write Cycle*18
tRASP
tRP
;
OE
tCLZ tCLZ tCLZ tOEZ tOEZ
22
EO
RAS
tT tCSH tRCD CAS tRAD tASR tRAH
tCP tHPC tCAS
tCP tRSH tCAS
tCRP
tCAS
L
tASC tCAH
tASC tCAH
tASC tCAH
Address
Row
Column 1
Column 2
tCWL
Column N
tCWL tRWL
tCWL tRCS tRCS
Pr
tRCS tWP tDZC tDS tDH tDH
WE
tWP tDZC tDS
tWP tDZC tDS tDH
uc od
Din 2 Din N tDZO
tOED tOEP tOEH tOEZ
Din
tDZO tOED
Din 1 tDZO
tOEP tOEH
tOED tOEP tOEH
Dout
High-Z
Invalid Dout
Invalid Dout
Invalid Dout
t
Data Sheet E0101H10
HB56UW1673E-F
EDO Page Mode Read-Modify-Write Cycle*18
t RASP
t RP
; ;
t AA t OEA t CAC t RAC t AA t CPA t OEA t CAC t AA t CPA t OEA t CAC t CLZ t OEZ t CLZ t OEZ t CLZ t OEZ
High-Z
EO
RAS tT t RCD
CAS
t HPRWC t CP t CAS t CP
t RSH
t CRP
t CAS
t CAS
t RAD t ASR
t ASC t RAH Row
L
t CAH
Column 1
t ASC t CAH
t ASC t CAH
Column N
Address
Column 2
t RWD t AWD t CWD WE t RCS t WP t DS t DZC
t CWL
t RCS
t CPW t AWD t CWD
t CWL
t RCS
t CPW t AWD t CWD
t CWL t RWL
Pr
t WP t DS t DZC t DH t DH
Din 1 Din 2
t WP t DS t DZC t DH
Din N
uc od
t OEP t OEH
Din t DZO t OED
t OEP t OEH
t DZO
t OED
t DZO
t OED
t OEP t OEH
OE t OHO
t OHO
t OHO
Dout
Dout 1
Dout 2
Dout N
t
23
Data Sheet E0101H10
HB56UW1673E-F
EDO Page Mode Mix Cycle (1) 20
t RP t RASP t CRP tCAS tCWL t RCS tCPW tAWD t ASC t CAH Column 2 tASC t CAH Column 3 tWP t RAL t CAH Column 4 t CAL t DS High-Z t DH Din 3 tRDD tCDD tRSH t RRH t RCH
;
tOEP tWED
OE
24
EO
RAS
tT
t CP t CAS
t CP tCAS
t CP
CAS
t CAS
t CSH
t RCD
t WCS
t WCH
t RCS
WE
L
t CAL t DH tCPA tAA tOEA tCAC Dout 2
tASR
Address
t ASC tRAH Row
tCAH
tASC
Column 1
t DS
Din
Pr
tOED tCPA tAA t OEZ t DOH tCAC t OHO
Dout 3
Din 1
tCPA
tAA
tOFR tWEZ tOEZ
tCAC
tOHO tOFF tOH
uc od
tOEA Dout 4
Dout
t
Data Sheet E0101H10
HB56UW1673E-F
EDO Page Mode Mix Cycle (2) 20
t RP t RASP
EO
RAS
tT
t CSH
t CP t CAS
t CP tCAS tCWL t RCS tCPW t ASC t CAH Column 3
t CP tCAS t RCS tWP t RAL tASC t CAH Column 4 t CAL t DS t DH Din 3 tRSH
t CRP
CAS
t CAS
t RCD
t RCHR
t RCS
t RCH
tWCS t WCH
t RRH t RCH
WE
L
t ASC t CAH Column 2 t DS t DH Din 2 High-Z t OEP tOED tCOL tAA tOEZ t OHO Dout 1
tASR
Address
t ASC tRAH Row
tCAH
Column 1 t CAL
tRDD tCDD
Din
Pr
t OEP tOED t OEA tCPA tAA tCAC tOEZ
Dout 3
tCOP
tWED
OE
tCPA tAA tCAC tOEA
tOFR tWEZ tOEZ tOHO tOFF tOH
tOEA tCAC tRAC
uc od
t OHO Dout 4
Dout
t
Data Sheet E0101H10 25
HB56UW1673E-F
Physical Outline
HB56UW1673E Series
Front side
3.00 0.118
8.89 0.350
Back side
4.00 0.157
17.78 0.700
Detail A 2.54 min 0.100 min 1.27 0.050 0.25 max 0.010 max
Detail B and C
3.175 0.125
1.00 0.05 0.039 0.002
3.125 0.125 0.123 0.005
6.35 0.250 2.00 0.10 0.079 0.004
Data Sheet E0101H10 26
31.75 1.250
168
EO
C 11.43 0.450 36.83 1.450
133.35 5.250 127.35 5.014
Unit: mm inch 4.00 max 0.157 max
;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; Component area ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; (Front) ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; 1 84
;; ; ;; ; ;; ; ;; ; ;; ; ;; ; ;; ;
3.00 0.118
B
A 54.61 2.150 1.27 0.10 0.050 0.004
2 - 3.00 2 - 0.118 85
;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; Component area ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; (Back) ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;; ;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;;
4.00 min 0.157 min
L
Pr
uc od t
HB56UW1673E-F
Cautions
1. Elpida Memory, Inc. neither warrants nor grants licenses of any rights of Elpida Memory, Inc.'s or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Elpida Memory, Inc. bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability. However, contact Elpida Memory, Inc. before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Elpida Memory, Inc. particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Elpida Memory, Inc. bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Elpida Memory, Inc. product does not cause bodily injury, fire or other consequential damage due to operation of the Elpida Memory, Inc. product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Elpida Memory, Inc.. 7. Contact Elpida Memory, Inc. for any questions regarding this document or Elpida Memory, Inc. semiconductor products.
EO
L
Data Sheet E0101H10 27
Pr
uc od t


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